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In this paper a sensitive measuring circuit is described for the measurement of current noise on high quality thin and thick film resistors. Measured data on resistors are presented and analysed.
Presented in this paper is a realization of Multi-Layer Substrate with 30 μm signal pattern width and 100 μm square via holes on a 100 mm square ceramic substrate. To obtain this fine signal pattern w...
NiCr thin film resistors are widely used in the current resistor technology. Ranging from discrete resistors up to highest performance hybrid integrated circuits, vacuum deposited NiCr alloys cover ex...
This paper describes the thin film technology used for telecommunication circuits in the Bell System. Vacuum deposition and photolithography form the basis for the film processing steps. Nitrogen dope...
The dependence of the breakdown voltage on the capacitor area has been examined by measurements on Al-Al2O3-metal thin film capacitors. The relation of Ub=kA1/c has been found for the breakdown voltag...
Thin ZnTe layers show memory switching characteristics. The electrical conduction in the non-ohmic off-state is shown to be due to Poole–Frenkel emission. An electrothermal model is proposed to explai...
A computer program has been developed, which calculates any adjustable thin film resistor from simple input data (electrical, geometrical, positional, orientational), punched on input cards”. The “ou...

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